* : Products list (parametric search)
* : Products list (parametric search)
* : Products list (parametric search)
* : Products list (parametric search)
* : Products list (parametric search)
* : Products list (parametric search)
* : Products list (parametric search)
* : Products list (parametric search)
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The information presented in this cross reference is based on TOSHIBA's selection criteria and should be treated as a suggestion only. Please carefully review the latest versions of all relevant information on the TOSHIBA products, including without limitation data sheets and validate all operating parameters of the TOSHIBA products to ensure that the suggested TOSHIBA products are truly compatible with your design and application.Please note that this cross reference is based on TOSHIBA's estimate of compatibility with other manufacturers' products, based on other manufacturers' published data, at the time the data was collected.TOSHIBA is not responsible for any incorrect or incomplete information. Information is subject to change at any time without notice.
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下载“第Ⅴ章:光半导体” (PDF:1.8MB)
第4步:检查每个设计常数
考虑工作温度、速度、使用寿命设计、电阻公差等是否具有足够的裕度。
温度范围 ⇒ VF,CTR,允许电流等。
负载电阻 ⇒ 开关速度,暗电流的影响等。
确认器件使用寿命
光耦的输入LED光输出会随着时间的推移而减弱。
必须确认特性满足要求,同时必须考虑器件在使用寿命目标期间的退化趋势。
光耦的老化变化可以根据输入电流(IF)和环境温度来计算。