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The information presented in this cross reference is based on TOSHIBA's selection criteria and should be treated as a suggestion only. Please carefully review the latest versions of all relevant information on the TOSHIBA products, including without limitation data sheets and validate all operating parameters of the TOSHIBA products to ensure that the suggested TOSHIBA products are truly compatible with your design and application.
Please note that this cross reference is based on TOSHIBA's estimate of compatibility with other manufacturers' products, based on other manufacturers' published data, at the time the data was collected.
TOSHIBA is not responsible for any incorrect or incomplete information. Information is subject to change at any time without notice.
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传统玻璃管保险丝和片式保险丝的结构可在发生过电流时通过加热熔化内部金属,然后断开导线,从而停止电流。
因此,其会一次性熔断,必须进行零件更换等操作才能再次使用。
而右图所示的eFuse IC可重复使用,因为内部过流电路可以高精度检测出电流以阻止内部MOSFET关断。