U-MOSⅨ-H系列大幅提高了代表损耗的品质因数

U-MOSⅨ-H系列融合了卓越的沟道工艺和封装技术,能提供业内一流的性能。U-MOSⅨ-H系列采用最新工艺和优化的单元结构制造,大幅改进了RDS(ON)×Qg,RDS(ON)×QSW和RDS(ON)×QOSS,这些是MOSFET的重要品质因数。

因此,U-MOSⅨ-H系列可显著降低主要损耗,包括导通损耗、驱动损耗、开关损耗和输出电荷损耗,这有助于提高电源系统的效率和降低MOSFET器件的温度。

TPH1R306PL:U-MOSⅨ-H、VDSS=60V、RDS(ON)最大值=1.34mΩ @ VGS=10V、SOP Advance

导通和驱动损耗
导通和驱动损耗
导通和开关损耗
导通和开关损耗
导通和输出电荷损耗
导通和输出电荷损耗

RDS(ON):导通电阻(导通损耗的品质因数)
Qg:栅极电荷(驱动损耗的品质因数)
QSW:栅极开关电荷(开关损耗的品质因数)
QOSS:输出电荷(输出电荷损耗的品质因数)

截至2018年1月(东芝调查)

当U-MOSⅨ-H 60V系列的TPH1R306PL与竞争对手的类似产品比较时,与开关损耗有关的RDS(ON)×QSW降低25%,与输出电荷损耗有关的RDS(ON)×QOSS降低32%。

TPH3R70APL:U-MOSⅨ-H、VDSS=100V、RDS(ON)最大值=3.7mΩ @ VGS=10V、SOP Advance

导通和驱动损耗
导通和驱动损耗
导通和开关损耗
导通和开关损耗
导通和输出电荷损耗
导通和输出电荷损耗

RDS(ON):导通电阻(导通损耗的品质因数)
Qg:栅极电荷(驱动损耗的品质因数)
QSW:栅极开关电荷(开关损耗的品质因数)
QOSS:输出电荷(输出电荷损耗的品质因数)

截至2018年1月(东芝调查)

当U-MOSⅨ-H 100V系列的TPH3R70APL与竞争对手的类似产品比较时,与开关损耗有关的RDS(ON)×QSW降低15%,与输出电荷损耗有关的RDS(ON)×QOSS降低14%。

U-MOSⅨ-H系列MOSFET

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