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The information presented in this cross reference is based on TOSHIBA's selection criteria and should be treated as a suggestion only. Please carefully review the latest versions of all relevant information on the TOSHIBA products, including without limitation data sheets and validate all operating parameters of the TOSHIBA products to ensure that the suggested TOSHIBA products are truly compatible with your design and application.
Please note that this cross reference is based on TOSHIBA's estimate of compatibility with other manufacturers' products, based on other manufacturers' published data, at the time the data was collected.
TOSHIBA is not responsible for any incorrect or incomplete information. Information is subject to change at any time without notice.
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由于SiC SBD的漏电流约为Si SBD的1/10,因此不太可能发生热失控。
对于传统Si SBD,有些产品即使在80%的额定电压下也有较大的漏电流,从热失控的角度来看这些产品很难使用Si SBD。
由于芯片材料(SiC)以及芯片设计优化(JBS结构:结势垒肖特基结构),我们的SiC SBD的漏电流约为Si SBD的1/10。
*:热失控
漏电流在高温下增加。因此,如果热损耗(=漏电流×外加电压)产生的热量超过包括封装在内的器件的散热性能,芯片内部温度会升高,最终导致热破坏。