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开关二极管的正向电压VF随着温度升高而降低。反向泄漏电流IR随着温度升高而增大。
半导体器件的电气特性通常对环境温度和工作结温敏感。 Si二极管的特性在工作范围内通常如下变化。
二极管之所以如此,主要有以下原因:
由于强键合,碳化硅(SiC)作为一种宽带隙(WBG)半导体,比硅更受晶格振动的影响。 由于宽带隙(WBG),供体电子在碳化硅(SiC)中比在硅中更不易被激发。因此,硅二极管和碳化硅二极管在其通常使用的电流范围内具有不同的温度特性。
下面显示了硅和碳化硅肖特基势垒二极管(SiC SBD)的IF–VF曲线。
对于硅肖特基势垒二极管,正向电压(VF)随着温度升高而降低。相反,对于碳化硅肖特基势垒二极管,VF随着温度升高而增加。在较高的IF下,硅和碳化硅肖特基势垒二极管的正向电压(VF)会随着温度升高而升高。
刚以肖特基势垒二极管为例进行了说明,但如图1所示,pn结二极管也显示出相同的趋势。由于上述温度特性,硅二极管比碳化硅二极管更容易发生热失控。
在电路设计中,需考虑电气特性的温度依从关系。
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