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The information presented in this cross reference is based on TOSHIBA's selection criteria and should be treated as a suggestion only. Please carefully review the latest versions of all relevant information on the TOSHIBA products, including without limitation data sheets and validate all operating parameters of the TOSHIBA products to ensure that the suggested TOSHIBA products are truly compatible with your design and application.
Please note that this cross reference is based on TOSHIBA's estimate of compatibility with other manufacturers' products, based on other manufacturers' published data, at the time the data was collected.
TOSHIBA is not responsible for any incorrect or incomplete information. Information is subject to change at any time without notice.
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该参考设计提供了过温检测IC ThermoflaggerTM应用电路(TCTH021AE/推挽型)的设计指南、数据和其他内容。与PTC热敏电阻结合使用,ThermoflaggerTM可用于检测设备内多个位置的过温。此参考设计还提供了ThermoflaggerTM其他应用电路的详细信息。
Click on components for more details
电路拓扑 | 过温检测IC ThermoflaggerTM的应用电路 |
---|---|
电路 | 过温检测电路、光检测电路、压力检测电路 |
设计文档包括下列文档。
设计数据包括下列内容。
器件型号 | 器件目录 | 搭载部位・数量 | 说明 |
---|---|---|---|
过温检测IC | 检测IC | 10μA,推挽型,过温检测IC | |
小信号MOSFET | 低边开关 | N沟道MOSFET,20V,0.18A,3.0Ω@4V,SOT-723(VESM) | |
小信号MOSFET | 高边开关 | P沟道MOSFET,-20V,-0.25A,1.4Ω@4.5V,SOT-723(VESM) |